GATS-2100: High Volume
Semiconductor Substrate Interconnect Tester
for C4, MCM, BGAs...

GATS-2100 Semiconductor Substrate Test System
with JEDEC tray load & unload
The GATS-2100 tester features concurrent operations including:
-
pre-align
-
load
-
CCD camera alignment
-
electrical test
-
unload
- sort of pass, opens, shorts, and
alignment errors
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The GATS-2100 concurrent approach
provides unmatched volume capability... 2.5 seconds per device

GATS-2100 Index Table with
concurrent operations
As with all Nidec-Read Test systems, the GATS-2100 offers you the most test technologies
for your requirements.
For Low Volume Semiconductor Substrate Interconnect
applications, check out the
GATS-3200 Flying Probe Tester.
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