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NEW!
GATS-3200: Fastest Flying Probe Test System
for Semiconductor
Substrate Interconnect Test - C4, MCM, BGAs...
GATS-3200 - Semiconductor Substrate Interconnect
Test System
Innovative VCM Flying Probe/Pin Grid Combination
The GATS-3200 Flying Probe combination test system is the solution
for Quick Turn test of prototype to low volume requirements for individual packages.
This unique
system features:
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Interconnect Test
Capability: |
- Test individual packages or
- Test Multi-image panels with
Step&Repeat Function
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Flying Probe Top: |
- single flying probe top using very
high speed voice coil motor (VCM) technology
- 50 - 100 tests per second ... high throughput
- Dual Flying Probe Top for
testing bump-to-bump nets
- flying probe head allows testing of
all nets including each power and ground point
- 4-wire test capability
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Pin Grid Bottom: |
- contacts all points at once to provide
dramatically reduced test time
- low cost universal grid ...
reduce fixture costs
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JEDEC Tray Load and Unload: |
- system accepts a stack of trays full
of parts
- system re-stacks pass and failed
devices separately
- Optional marking unit
- cassette load/unload optional
... increased operator efficiency
... less operator handling of parts |
For High Volume requirements for Semiconductor Substrate
Interconnect Testing check out the GATS-2100 High Volume
System.
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